Methods and Systems for Analyzing Samples using Partical Irradition

Creator

• Constantine Tarawneh, The University of Texas Rio Grande Valley
• Nabanita Dasgupta-Schubert
• Michael Persans, The University of Texas Rio Grande Valley

Identifier

US20070274455A1.pdf

Files

Creation Date

11-29-2007

Patent Number

US 2007/0274455 A1

Assignee

The University of Texas System Board of Regents (UTRGV)

Description

Systems and methods for an in situ, non destructive analysis of organic or inorganic material are disclosed. In one respect, a particle induced x-ray emission system, having a footprint of less than one square meter, includes a sample holder supporting a sample, a source holder supporting one or more radioactive source and a detector. A radioactive transmission from the one or more radioactive source to the sample results in a fluorescent emission of the sample and collected by the detector. In one respect, fluorescent emission may be used to determine elements found in the sample. Additionally, the amounts of each of the determined elements found in the sample may also be determined.

Application Number

11/681,613

Date Filed

March 2007

Physical Description

.PDF, 19 Pages, Text, Images

Recommended Citation

Tarawneh, Constantine; Dasgupta-Schubert, Nabanita; and Persans, Michael, "Methods and Systems for Analyzing Samples using Partical Irradition" (2007). Patents. 13.
https://scholarworks.utrgv.edu/patents/13